The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Sep. 24, 2015
Applicants:

Carl M. Edwards, Katy, TX (US);

Ian Turner, Bedford, MA (US);

Inventors:

Carl M. Edwards, Katy, TX (US);

Ian Turner, Bedford, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 8/22 (2006.01); G01J 9/02 (2006.01); G01H 9/00 (2006.01); G01P 15/093 (2006.01); G02B 5/28 (2006.01);
U.S. Cl.
CPC ...
G01V 8/22 (2013.01); G01H 9/004 (2013.01); G01J 9/0246 (2013.01); G01P 15/093 (2013.01); G01V 2210/1429 (2013.01); G02B 5/284 (2013.01);
Abstract

An embodiment of an apparatus for estimating a parameter includes a light source configured to emit an optical signal, and an interferometer including a first reflector assembly having at least one reflective surface and a second reflector assembly having a plurality of individual reflective surfaces facing the at least one reflective surface. At least one of the first reflective assembly and the second reflector assembly is moveable in response to a stimulus, the plurality of individual reflective surfaces disposed at a fixed location relative to each other, each individual reflective surface defining a different optical cavity length relative to the first reflector assembly.


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