The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2018
Filed:
Sep. 16, 2016
Guzik Technical Enterprises, Mountain View, CA (US);
Anatoli B. Stein, Atherton, CA (US);
Alexander Taratorin, Palo Alto, CA (US);
Semen P. Volfbeyn, Palo Alto, CA (US);
Guzik Technical Enterprises, Mountain View, CA (US);
Abstract
Measurement of group delay for a device under test (DUT). A test signal includes (i) a low frequency sine wave f, (ii) sine wave harmonics at a high frequency f, (iii) L pairs of sideband components at frequencies k·f±2·f, where k odd, and M pairs of sideband components at frequencies k·f±f, where k is even. At DUT output, (i) phase ϕat frequency fis measured, (ii) both sideband phase ϕ(k) at frequencies k·f+2·fand phase ϕ(k) at frequencies k·f−2·ffor odd k, are measured, and (iii) both sideband phases ϕ(k) at frequencies k·f+fand ϕ(k) at frequencies k·f−ffor even k, are measured. Group delay τat frequencies k·F, are determined from: τ=(ϕ(k)−ϕ(k)−4·ϕ)/(4·f) for k odd, and τ=(ϕ(k)−ϕ(k)−2·ϕ)/(2·f) for k even.