The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2018
Filed:
Jan. 06, 2017
Fluke Corporation, Everett, WA (US);
David L. Epperson, Everett, WA (US);
Jeffrey Worones, Seattle, WA (US);
Ricardo Rodriguez, Mill Creek, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
Systems and methods of providing a magnetically coupled ground reference probe for use with test equipment, such as digital multimeters (DMMs). The magnetically coupled ground reference probes disclosed herein may be used instead of a typical test probe or alligator clip. A magnetically coupled ground reference probe may be provided which includes an insulative housing surrounding a conductive magnet such as a permanent magnet or an electromagnet. The magnet may autonomously retract into a cavity of the insulative housing when not coupled to a ground reference so that the magnet does not contact a high potential source when being handled by the operator. In at least some implementations, at least a portion of the insulation material of the housing may be compressible to allow the magnet to come into physical contact with a ground reference surface while providing a sufficient creepage and clearance path.