The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9933455 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 03, 2018

Filed:

May. 04, 2015
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Young Kyu Song, San Diego, CA (US);

Kyu-Pyung Hwang, Newton, MA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 1/073 (2006.01); G01R 31/28 (2006.01); G01R 29/08 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/045 (2013.01); G01R 1/07314 (2013.01); G01R 31/2822 (2013.01); G01R 1/06722 (2013.01); G01R 1/06772 (2013.01); G01R 29/08 (2013.01);
Abstract

Embodiments contained in the disclosure provide a method and apparatus for testing an electronic device. An electronic device is installed in a test socket guide. A pusher tip applies a load to the guided coaxial spring probes and forces contact with pads on the device. Test and ground signals are routed through the device and test socket. The apparatus includes a socket having at least one guided coaxial spring probe pin. A socket guide shim is positioned between the receptacle for the electronic device and the socket. A socket guide aids positioning. A pusher tip is placed on the side opposite that of the guided coaxial spring probe pins. The pusher tip mates with a pusher shim and the pusher spring. A top is then placed on the assembly and acts to compress the pusher spring and engage the guided coaxial spring probe pins with the pads on the device.


Find Patent Forward Citations

Song, Young. (2018). Known good die testing for high frequency applications (U.S. Patent No. 9933455). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9933455

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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