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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9933405 B1

PDFFull Text
Date of Patent:
Apr. 03, 2018

Filed:

Apr. 08, 2016

Immature ear photometry in maize

Applicant:

Pioneer Hi-bred International, Inc., Johnston, IA (US);

Inventors:

Guofu Li, Johnston, IA (US);

Travis A Hanselman, Johnston, IA (US);

Jacque Hockenson, Madrid, IA (US);

Dale F Loussaert, Clive, IA (US);

Timothy Michael Moriarty, Urbandale, IA (US);

Rachael Woods, Johnston, IA (US);

Assignee:

PIONEER HI-BRED INTERNATIONAL, INC., Johnston, IA (US);

Attorney:

Pioneer Hi-Bred Int'l, Inc.

Primary Examiner:

Jon Chang

Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06K 9/46 (2006.01); G01N 33/00 (2006.01); C12N 15/82 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0098 (2013.01); C12N 15/821 (2013.01); C12N 15/8209 (2013.01); G06K 9/46 (2013.01); G06T 7/0004 (2013.01); G06T 7/0012 (2013.01); G06T 2207/30004 (2013.01); G06T 2207/30128 (2013.01);
Abstract

Methods for evaluating one or more immature ears of maize are presented in which digital imagery and image processing are used to assess physical properties of immature maize ears that are correlated with yield and other yield-related traits. Also provided are methods for identifying leads using immature ear photometry.

Find Patent Forward Citations

Li, Guofu. (2018). Immature ear photometry in maize (U.S. Patent No. 9933405). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9933405

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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