The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Feb. 21, 2012
Applicants:

Kanako Iwamura, Haga-gun, JP;

Shoichi Kanayama, Otawara, JP;

Inventors:

Kanako Iwamura, Haga-gun, JP;

Shoichi Kanayama, Otawara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/59 (2006.01); G01N 21/25 (2006.01); G01N 35/02 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 21/253 (2013.01); G01N 35/025 (2013.01); G01N 35/04 (2013.01); G01N 2035/0455 (2013.01); G01N 2201/0415 (2013.01); G01N 2201/124 (2013.01); G01N 2201/127 (2013.01); G01N 2201/1245 (2013.01);
Abstract

According to one embodiment, an automatic analyzer comprises a light source, a spectroscope, a photo detection unit, a storage unit, a selection unit, and a calculation unit. The storage unit stores photo detector identifiers related to photo detectors and wavelength band identifiers in association with each other. The selection unit selects a specific photo detector from photo detectors. The specific photo detector corresponds to a specific photo detector identifier associated with a wavelength band identifier of a wavelength band according to a measurement item of a sample. The calculation unit calculates an absorbance related to the measurement item based on a signal from the selected specific photo detector.


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