The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2018

Filed:

Feb. 03, 2015
Applicant:

Infosys Limited, Bangalore, IN;

Inventors:

Gopichand Agnihotram, Guntur, IN;

Hari Manassery Koduvely, Bangalore, IN;

Assignee:

Infosys Limited, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/52 (2006.01); G01N 17/00 (2006.01); G06Q 10/00 (2012.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G01N 17/00 (2013.01); G06Q 10/00 (2013.01);
Abstract

The technique relates to a system and method for assessing corroded pipeline defect growth rate from partial defect growth rate information. The method involves obtaining a plurality of observed defect growth rates from the inspection data collected at different time intervals then determining at least one unobserved defect growth rate on the basis of distribution pattern of the plurality of observed defect growth rates thereafter simulating condition of at least one hyper parameter on the inspection data based on prior information of the at least one hyper parameter then simulating the plurality of observed defect growth rates and the at least one unobserved defect growth rate based on the simulated hyper parameters and finally obtaining defect growth rate point estimate from the simulated growth rate data. The method also involves determining a probability of failure of a defect from the defect growth rate point estimates.


Find Patent Forward Citations

Agnihotram, Gopichand. (2018). Method for assessing corroded pipeline defect growth from partial inspection data and devices thereof (U.S. Patent No. 9933353). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9933353

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