The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9932687 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 03, 2018

Filed:

Oct. 09, 2015
Applicant:

California Institute of Technology, Pasadena, CA (US);

Inventors:

Carl L. Hansen, Pasadena, CA (US);

Stephen R. Quake, San Marino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 7/08 (2006.01); C30B 7/14 (2006.01); B01L 3/00 (2006.01); B01L 9/00 (2006.01); C12Q 1/68 (2018.01); F04B 43/04 (2006.01); F16K 99/00 (2006.01); B01L 3/06 (2006.01); B01L 7/00 (2006.01);
U.S. Cl.
CPC ...
C30B 7/08 (2013.01); B01L 3/06 (2013.01); B01L 3/50273 (2013.01); B01L 3/502707 (2013.01); B01L 3/502738 (2013.01); B01L 3/502761 (2013.01); B01L 9/527 (2013.01); C12Q 1/6874 (2013.01); C30B 7/14 (2013.01); F04B 43/043 (2013.01); F16K 99/0001 (2013.01); F16K 99/0015 (2013.01); F16K 99/0026 (2013.01); F16K 99/0059 (2013.01); B01J 2219/00274 (2013.01); B01L 7/54 (2013.01); B01L 2200/025 (2013.01); B01L 2200/027 (2013.01); B01L 2200/0605 (2013.01); B01L 2200/0642 (2013.01); B01L 2200/10 (2013.01); B01L 2300/0681 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0861 (2013.01); B01L 2300/0864 (2013.01); B01L 2300/0887 (2013.01); B01L 2300/123 (2013.01); B01L 2300/14 (2013.01); B01L 2300/18 (2013.01); B01L 2300/1827 (2013.01); B01L 2400/049 (2013.01); B01L 2400/0481 (2013.01); B01L 2400/0638 (2013.01); B01L 2400/0655 (2013.01); B01L 2400/0688 (2013.01); F16K 99/0034 (2013.01); F16K 2099/008 (2013.01); F16K 2099/0074 (2013.01); F16K 2099/0078 (2013.01); F16K 2099/0084 (2013.01); F16K 2099/0094 (2013.01); Y10T 117/1004 (2015.01); Y10T 117/1008 (2015.01); Y10T 137/0318 (2015.04); Y10T 137/0396 (2015.04);
Abstract

High throughput screening of crystallization of a target material is accomplished by simultaneously introducing a solution of the target material into a plurality of chambers of a microfabricated fluidic device. The microfabricated fluidic device is then manipulated to vary the solution condition in the chambers, thereby simultaneously providing a large number of crystallization environments. Control over changed solution conditions may result from a variety of techniques, including but not limited to metering volumes of crystallizing agent into the chamber by volume exclusion, by entrapment of volumes of crystallizing agent determined by the dimensions of the microfabricated structure, or by cross-channel injection of sample and crystallizing agent into an array of junctions defined by intersecting orthogonal flow channels.


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