The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2018
Filed:
Aug. 04, 2015
Seek Thermal, Inc., Santa Barbara, CA (US);
Romeo Chahine, Goleta, CA (US);
William J. Parrish, Santa Barbara, CA (US);
Seek Thermal, Inc., Santa Barbara, CA (US);
Abstract
A method for offset correction in an imaging system comprising acquiring image data representative of at least a portion of a frame of pixel intensity values from the detector array at two times with a shutter closed. The method includes determining an offset value function for individual pixels based on the image data acquired with the shutter closed. The method includes acquiring subsequent scene image data with the shutter open, and adjusting the scene image data relative to the flat field as predicted by the offset value function at the time the scene image data was acquired to correct for offset drift of the imaging system. In some embodiments, the imaging array is an infrared Focal Plane Array (IR FPA) in a thermal imaging camera.