The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

May. 09, 2016
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventor:

Christopher Parks, Pittsford, NY (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/372 (2011.01); H01L 27/148 (2006.01);
U.S. Cl.
CPC ...
H04N 5/37213 (2013.01); H01L 27/14812 (2013.01); H01L 27/14818 (2013.01); H01L 27/14831 (2013.01);
Abstract

Methods of measuring and calibrating the gain of a CCD imaging system are described. Charge injectors may be present on either side of an image sensor array that provide test charges to respective calibration VCCDs. Test charges may be transferred to upper and lower HCCDs during quad-output read out or to only the lower HCCD during dual-output or single-output read out. In each quadrant of the imaging system, test charges may be transferred to an EMCCD output or to a non-EMCCD output via a charge switch based on the magnitude of the test charges. The gains of all EMCCD outputs and non-EMCCD outputs in the imaging system may be calibrated against one another by adjusting the gain at each output when a discrepancy is detected between any two outputs.


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