The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2018
Filed:
Jun. 13, 2016
Oracle International Corporation, Redwood Shores, CA (US);
Kenny C. Gross, Escondido, CA (US);
Kalyanaraman Vaidyanathan, San Diego, CA (US);
Dustin R. Garvey, Oakland, CA (US);
Lik Wong, Palo Alto, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
The disclosed embodiments relate to a system that gathers telemetry data while testing a computer system. During operation, the system obtains a test script that generates a load profile to exercise the computer system, wherein a running time of the test script is designed to be relatively prime in comparison to a sampling interval for telemetry data in the computer system. Next, the system gathers telemetry data during multiple successive executions of the test script on the computer system. The system merges the telemetry data gathered during the multiple successive executions of the test script, wherein the relatively prime relationship between the running time of the test script and the sampling interval for the telemetry data causes a sampling point for the telemetry data to precess through different points in the test script during the multiple successive executions of the test script, thereby densifying sampled telemetry data points gathered for the test script. Finally, the system outputs the densified telemetry data.