The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Nov. 04, 2015
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Cristina Ciochina-Duchesne, Rennes, FR;

Loic Brunel, Rennes, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 4/00 (2009.01); H04B 7/204 (2006.01); H04B 7/185 (2006.01);
U.S. Cl.
CPC ...
H04B 7/2041 (2013.01); H04B 7/18523 (2013.01);
Abstract

The present invention concerns a method for determining if at least one interferer generated by cross polarization interference is present in a received frame. The method comprises the steps of: —analyzing the received frame using a sliding window which analyzes at least a part of a first and second planes of the received frame, —determining a factor of merit for each position of the sliding window, —comparing each factor of merit to a threshold in order to determine if at least one interfered zone is present in the received frame, —analyzing the factors of merit in order to determine the number of interferers which are present in each interfered zone, —determining the start/end positions of each interferer in the first and second planes of the received frame.


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