The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Apr. 27, 2016
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Kazuyoshi Mizutani, Shizuoka, JP;

Yu Iwai, Shizuoka, JP;

Ichiro Koyama, Shizuoka, JP;

Yoshitaka Kamochi, Shizuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/52 (2006.01); G03F 7/038 (2006.01); G03F 7/039 (2006.01); G03F 7/11 (2006.01); B32B 27/08 (2006.01); H01L 51/42 (2006.01); H01L 51/44 (2006.01); G03F 7/004 (2006.01); G03F 7/32 (2006.01);
U.S. Cl.
CPC ...
H01L 51/5253 (2013.01); B32B 27/08 (2013.01); G03F 7/0045 (2013.01); G03F 7/038 (2013.01); G03F 7/039 (2013.01); G03F 7/0382 (2013.01); G03F 7/0392 (2013.01); G03F 7/0397 (2013.01); G03F 7/11 (2013.01); G03F 7/325 (2013.01); H01L 51/4253 (2013.01); H01L 51/448 (2013.01); B32B 2307/4026 (2013.01); B32B 2307/54 (2013.01); B32B 2457/00 (2013.01); B32B 2457/14 (2013.01); Y02E 10/549 (2013.01); Y02P 70/521 (2015.11);
Abstract

Provided are a laminate which is capable of forming an excellent organic semiconductor pattern, a kit for manufacturing an organic semiconductor, which is used to manufacture such a laminate, and a resist composition for manufacturing an organic semiconductor, which is used for the kit for manufacturing an organic semiconductor. The laminate includes an organic semiconductor film, a protective film on the organic semiconductor film, and a resist film on the protective film, in which the resist film is formed of a photosensitive resin composition that contains a photoacid generator (A) which generates an organic acid of which a pKa of the generated acid is −1 or less and a resin (B) which reacts with an acid generated by the photoacid generator so that the rate of dissolution in a developer containing an organic solvent is decreased.


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