The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Jun. 05, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Juri Lee, Yongin-si, KR;

Yong-Suk Tak, Seoul, KR;

Sung-Dae Suk, Seoul, KR;

Seungmin Song, Yongin-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Samsung-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/092 (2006.01); H01L 21/8238 (2006.01); H01L 29/06 (2006.01); H01L 29/10 (2006.01); H01L 29/423 (2006.01);
U.S. Cl.
CPC ...
H01L 27/0924 (2013.01); H01L 21/823807 (2013.01); H01L 21/823821 (2013.01); H01L 21/823828 (2013.01); H01L 21/823878 (2013.01); H01L 29/0653 (2013.01); H01L 29/1037 (2013.01); H01L 29/42356 (2013.01);
Abstract

Disclosed are semiconductor devices including a field effect transistor and methods of manufacturing the same. The semiconductor device comprises a device isolation layer in an upper portion of a substrate, first active patterns on a first region of the substrate and second active patterns on a second region of the substrate, gate structures extending in one direction and running across the first and second active patterns, and a blocking layer on a recessed region of the device isolation layer of the first region. Each of the first and second active patterns comprises a plurality of semiconductor patterns that are vertically stacked and spaced apart from each other. The semiconductor patterns of the first active patterns have conductivity different from that of the semiconductor patterns of the second active patterns. The blocking layer is limited on the first region.


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