The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Sep. 18, 2014
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Thomas Mittelholzer, Zürich, CH;

Nikolaos Papandreou, Thalwil, CH;

Haris Pozidis, Thalwil, CH;

Assignee:

GLOBALFOUNDRIES, INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 29/02 (2006.01); G11C 7/10 (2006.01); G11C 7/14 (2006.01); G11C 11/56 (2006.01); G11C 13/00 (2006.01);
U.S. Cl.
CPC ...
G11C 29/021 (2013.01); G11C 7/1006 (2013.01); G11C 7/14 (2013.01); G11C 11/5678 (2013.01); G11C 13/004 (2013.01); G11C 29/028 (2013.01);
Abstract

Methods and apparatus are provided for determining level-thresholds for q-level memory cells. A plurality of the memory cells are read to obtain respective read signal components. The read signal components are processed in dependence on signal level to produce a signal level vector, comprising a series of elements, indicative of the distribution of read signal components in order of signal level. The signal level vector is scanned with a sliding window of length greater than the spacing of successive window positions in the scan. At each window position, a metric Mi is calculated in dependence on the elements of the signal level vector in the window. A level-threshold for successive memory cell levels is then determined in dependence on variation of the metric over the scan.


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