The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Oct. 21, 2014
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Makoto Kitamura, Hachioji, JP;

Yamato Kanda, Hino, JP;

Takashi Kono, Tachikawa, JP;

Masashi Hirota, Hachioji, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); A61B 1/04 (2006.01); A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); A61B 1/00009 (2013.01); A61B 1/04 (2013.01); G06T 2207/10068 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30028 (2013.01);
Abstract

An image processing apparatus includes: an abnormality candidate region identifying unit configured to identify a candidate region for an abnormality from an image obtained by imaging inside of a lumen of a living body; a surrounding region determining unit configured to determine a surrounding region surrounding the candidate region; a shape information calculating unit configured to calculate shape information of the candidate region and shape information of the surrounding region in a depth direction with respect to a screen; and an abnormality region determining unit configured to determine whether or not the candidate region is an abnormality, based on a correlation between the shape information of the candidate region and the shape information of the surrounding region.


Find Patent Forward Citations

Loading…