The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Sep. 04, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Ankur Datta, White Plains, NY (US);

Balamanohar Paluri, Atlanta, GA (US);

Sharathchandra U. Pankanti, Darien, CT (US);

Yun Zhai, Pound Ridge, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/246 (2017.01); G06K 9/00 (2006.01); G08B 13/196 (2006.01); G06F 19/24 (2011.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00771 (2013.01); G06F 19/24 (2013.01); G06K 9/6284 (2013.01); G06T 7/251 (2017.01); G08B 13/19606 (2013.01);
Abstract

Local models learned from anomaly detection are used to rank detected anomalies. The local model patterns are defined from image feature values extracted from an image field of video image data with respect to different predefined spatial and temporal local units, wherein anomaly results are determined by fitting extracted image features to the local model patterns. Image features values extracted from the image field local units associated with anomaly results are normalized, and image feature values extracted from the image field local units are clustered. Weights for anomaly results are learned as a function of the relations of the normalized extracted image feature values to the clustered image feature values. The normalized values are multiplied by the learned weights to generate ranking values to rank the anomalies.


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