The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Jul. 17, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Haim Avron, White Plains, NY (US);

Vikas Sindhwani, Hawthorne, NY (US);

David P. Woodruff, Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06F 17/16 (2006.01); G06F 17/10 (2006.01); G06F 17/27 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G06F 17/10 (2013.01); G06F 17/16 (2013.01); G06F 17/2785 (2013.01);
Abstract

A system, method and computer program product for quickly and approximately solving structured regression problems. In one aspect, the system, method and computer program product are applied to problems that arise naturally in various statistical modeling settings—when the design matrix is a Vandermonde matrix or a sequence of such matrices. Using the Vandermonde matrix structure further accelerates the solution of the regression problem, achieving running times that are faster than 'input sparsity'. The modeling framework speedup benefits of randomized regression for solving structured regression problems.


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