The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2018
Filed:
Aug. 27, 2015
Applicant:
Qualcomm Incorporated, San Diego, CA (US);
Inventors:
Xin Wang, San Diego, CA (US);
Young Cheul Yoon, San Diego, CA (US);
Bardia Fallah Behabadi, Pasadena, CA (US);
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); G06F 17/14 (2006.01); G06N 99/00 (2010.01); H04N 19/60 (2014.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06F 17/141 (2013.01); G06F 17/14 (2013.01); G06N 99/005 (2013.01); H04N 19/60 (2014.11); G06N 3/049 (2013.01);
Abstract
A method of processing asynchronous event-driven input samples of a continuous time signal includes calculating a short-time Fourier transform (STFT) output based on the event-driven input samples. The STFT output may be calculated by expressing an encoding pulse and an STFT window function as a sum of complex weighted causal complex exponentials. The method further includes interpolating output between events.