The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Aug. 11, 2016
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Jed H. Rankin, Richmond, VT (US);

Adam C. Smith, Essex Junction, VT (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/70 (2012.01); G03F 1/78 (2012.01); G03F 1/20 (2012.01); G03F 7/20 (2006.01); H01L 21/027 (2006.01); B82Y 10/00 (2011.01); G06F 17/50 (2006.01); B82Y 40/00 (2011.01); H01J 37/317 (2006.01);
U.S. Cl.
CPC ...
G03F 1/70 (2013.01); B82Y 10/00 (2013.01); B82Y 40/00 (2013.01); G03F 1/20 (2013.01); G03F 1/78 (2013.01); G03F 7/20 (2013.01); G03F 7/2037 (2013.01); G03F 7/2063 (2013.01); G03F 7/7025 (2013.01); G06F 17/50 (2013.01); G06F 17/5068 (2013.01); G06F 17/5081 (2013.01); H01L 21/0274 (2013.01); G06F 2217/12 (2013.01); H01J 37/3174 (2013.01); Y10S 430/143 (2013.01);
Abstract

A method and system for: forming a first rectangular shape with photomask writing equipment, using a first sub-threshold dosage on a photoresist layer of a photomask substrate; forming an overlapping second rectangular shape with the photomask writing equipment using a second sub-threshold dosage on the photoresist layer, the second rectangular shape being rotated relative to the first rectangular shape to form one of: a hexagonal overlap area and an octagonal overlap area, that exposes the photoresist layer to at least a threshold dosage; and forming a photomask, based on developing the exposed photoresist layer, to provide optical transmission corresponding to the one of: the hexagonal overlap area of at least the threshold dosage and the octagonal overlap area of at least the threshold dosage, for use by a photolithography system to write any of a contact, a via, or a curvilinear shape on an integrated circuit substrate.


Find Patent Forward Citations

Loading…