The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2018
Filed:
Jan. 15, 2014
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Robert G. Gerowitz, Raleigh, NC (US);
Sarah B. Higgins, Chapel Hill, NC (US);
Joseph A. Iadanza, Hinesburg, VT (US);
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 29/18 (2006.01); H04B 1/38 (2015.01); H03D 3/24 (2006.01); H04L 27/06 (2006.01); H04L 7/06 (2006.01); H04K 1/10 (2006.01); G06F 1/26 (2006.01); G01R 25/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/317 (2013.01); G01R 25/005 (2013.01); G01R 31/31703 (2013.01); G01R 31/31707 (2013.01); G01R 29/18 (2013.01);
Abstract
Approaches for testing phase rotators are provided. A circuit for testing phase rotators includes a compare element including a first input and a second input, wherein the compare element is configured to compare a first phase of a first signal provided at the first input to a second phase of a second signal provided at the second input. The circuit also includes a first test bus connected to the first input and a second test bus connected to the second input.