The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2018
Filed:
Jan. 20, 2016
The Texas A&m University System, College Station, TX (US);
Vladislav Victorovich Yakovlev, College Station, TX (US);
Edward S. Fry, College Station, TX (US);
John David Mason, College Station, TX (US);
Joel Nathan Bixler, San Antonio, TX (US);
Michael Thomas Cone, Houston, TX (US);
Brett Harrison Hokr, Bryan, TX (US);
The Texas A&M University System, College Station, TX (US);
Abstract
Disclosed is a high reflectivity integrating cavity and device to amplify and detect luminescent emissions produced by small concentrations of materials to be analyzed. Femto or nano molar concentrations of a material can be placed within the high reflectivity integrating cavity. At least the interior surface of the high reflectivity integrating cavity can comprise a coating that, at a designated wavelength of electromagnetic radiation, is transparent and non-absorbing to such designated wavelengths of electromagnetic radiation. In addition to the isotropic field induced by the interior surface of the high reflectivity integrating cavity, the high reflectivity of the interior surface of the high reflectivity integrating cavity leads to very large effective optical path lengths within the interior of the high reflectivity integrating cavity, thereby amplifying the luminescent emissions produced by the sample.