The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Dec. 16, 2013
Applicant:

United Technologies Corporation, Farmington, CT (US);

Inventors:

Wenji Peng, Glastonbury, CT (US);

Jeffrey A Umbach, Palm Beach Garden, FL (US);

Kevin D Smith, Glastonbury, CT (US);

Assignee:

UNITED TECHNOLOGIES CORPORATION, Farmington, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/26 (2006.01); G01N 29/06 (2006.01);
U.S. Cl.
CPC ...
G01N 29/262 (2013.01); G01N 29/0645 (2013.01); G01N 2291/0234 (2013.01); G01N 2291/044 (2013.01); G01N 2291/106 (2013.01); G01N 2291/2634 (2013.01); G01N 2291/2694 (2013.01);
Abstract

A computer-implemented method for evaluating echo signals obtained from a phased array experiment on a billet is disclosed. The computer-implemented method may comprise collecting the echo signals from a pulser/receiver unit, correlating the echo signals with a position on a longitudinal axis and a circumferential angle of the billet, computing an amplitude for each of the echo signals, displaying the amplitudes as indications in a c-scan data plot at a computer display unit, and determining the signal-to-noise ratios of indications located in a region-of-interest box relative to noise in surrounding boxes in the c-scan data plot. The computer-implemented method may further comprise classifying each indication as rejectable, reportable, or insignificant based on its amplitude and signal-to-noise ratio. The computer-implemented method may find applications in quality control evaluations in the aircraft industry.


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