The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Apr. 28, 2015
Applicant:

Vibrant Corporation, Albuquerque, NM (US);

Inventor:

Leanne Jauriqui, Albuquerque, NM (US);

Assignee:

Vibrant Corporation, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/12 (2006.01);
U.S. Cl.
CPC ...
G01N 29/12 (2013.01);
Abstract

A resonance inspection tool is disclosed that may be configured to assign a part to a first classification (accepted part) or a second classification (rejected part) using a cluster combination array. Such a cluster combination array may be defined from a first cluster array having a plurality of first clusters (each being of the first classification), and from a second cluster array having a plurality of second clusters (each being of the second classification). One cluster combination array presents all possible combinations of the same first cluster from the first cluster array and each second cluster from the second cluster array, where each such cluster combination includes a corresponding sort. Another cluster combination array presents all possible combinations of the same second cluster from the second cluster array and each first cluster from the first cluster array, where each such cluster combination includes a corresponding sort.


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