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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9927340 B1

PDFFull Text
Date of Patent:
Mar. 27, 2018

Filed:

Nov. 09, 2012

Vibration analysis for blasting

Applicant:

Orica International Pte Ltd, Singapore, SG;

Inventors:

Kim Nigel Henley, Tennyson, AU;

Donald Scott Scovira, Highlands Ranch, CO (US);

Alexander Theofile Spathis, Newcastle, AU;

Ruilin Yang, Centennial, CO (US);

Assignee:

Orica International Pte Ltd, Singapore, SG;

Attorney:

Kilpatrick Townsend & Stockton LLP

Primary Examiner:

Elias Desta

Int. Cl.
CPC ...
G01B 5/28 (2006.01); G01N 3/313 (2006.01); G01H 17/00 (2006.01); G01N 29/04 (2006.01); G01N 29/44 (2006.01); G01V 1/18 (2006.01); G01V 1/04 (2006.01);
U.S. Cl.
CPC ...
G01N 3/313 (2013.01); G01H 17/00 (2013.01); G01N 29/04 (2013.01); G01N 29/44 (2013.01); G01V 1/18 (2013.01); G01N 2291/023 (2013.01); G01N 2291/028 (2013.01); G01N 2291/0423 (2013.01); G01V 1/04 (2013.01);
Abstract

A process for vibration analysis, including the steps of: receiving synchronized motion measurements of particle motion in two or three orthogonal dimensions over a selected period of time at a plurality of different measurement locations; and determining one or more strain waveforms in the orthogonal dimensions in regions spanning the plurality of measurement locations using the motion measurements.

Find Patent Forward Citations

Henley, Kim. (2018). Vibration analysis for blasting (U.S. Patent No. 9927340). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9927340

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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