The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9927309 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 27, 2018

Filed:

Sep. 08, 2014
Applicant:

Toshiba Memory Corporation, Minato-ku, JP;

Inventors:

Makoto Hara, Yokohama, JP;

Shuuji Matsumoto, Sagamihara, JP;

Hirosi Ootuka, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G01K 19/00 (2006.01); G01K 13/00 (2006.01); G01K 3/00 (2006.01); G01K 7/01 (2006.01);
U.S. Cl.
CPC ...
G01K 15/007 (2013.01); G01K 3/005 (2013.01); G01K 7/01 (2013.01); G01K 13/00 (2013.01);
Abstract

According to one embodiment, there is provided a semiconductor device including a temperature detection circuit and a test circuit. The temperature detection circuit is configured to detect a temperature by comparing potential of a reference block and reference potential. The test circuit is configured to test, in a test mode, an operation of the temperature detection circuit by serially switching a value of the reference potential to a value selected from a plurality of values, which is different from each other, while a temperature of the semiconductor device is kept at a first temperature.


Find Patent Forward Citations

Hara, Makoto. (2018). Semiconductor device and test method (U.S. Patent No. 9927309). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9927309

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