The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2018
Filed:
Apr. 18, 2016
Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
A spectroscopic measurement apparatus includes a light source, a diffraction grating being a spectroscopic unit, a spatial filter unit, a detection unit, and an analysis unit. The diffraction grating spatially disperses light from the light source, and outputs the light to different optical paths according to a wavelength. The spatial filter unit inputs the light from the diffraction grating to different positions according to the wavelength, applies loss depending on the wavelength to the light, and outputs the light. The detection unit detects the intensity of the light from the spatial filter unit. The analysis unit obtains the intensities of light in an absorption band and light in a non-absorption band of a component in a measurement sample on an optical path between the light source and the detection unit based on the detection result, and evaluates the component in the measurement sample.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile