The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2018
Filed:
Jun. 25, 2014
Applicant:
Sony Corporation, Tokyo, JP;
Inventor:
Masato Kimishima, Tokyo, JP;
Assignee:
SONY CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 17/38 (2006.01); G01C 17/28 (2006.01); G01C 17/02 (2006.01); G01C 21/26 (2006.01); G01C 21/16 (2006.01); G01C 21/30 (2006.01);
U.S. Cl.
CPC ...
G01C 17/38 (2013.01); G01C 17/02 (2013.01); G01C 17/28 (2013.01); G01C 21/16 (2013.01); G01C 21/26 (2013.01); G01C 21/30 (2013.01);
Abstract
To be capable of realizing a technique which enables a measurement error of a magnetic sensor to be obtained with higher accuracy, there is provided an information processing apparatus including: a fluctuation measuring unit configured to measure temporal fluctuation of a magnetic value measured by a magnetic sensor during movement of at least the magnetic sensor or information obtained based on the magnetic value, and a measurement error acquiring unit configured to obtain a measurement error of the magnetic sensor based on the fluctuation.