The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2018
Filed:
Jan. 24, 2013
Siemens Aktiengesellschaft, München, DE;
Lukasz Adam Bienkowski, Munich, DE;
Christian Homma, Kirchheim b. Munich, DE;
Hubert Mooshofer, Munich, DE;
Max Rothenfusser, Munich, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
In order to support an inspecting person in a method for the manual non-destructive inspection of a test object, a detection device is provided for detecting three-dimensional surface coordinates of a region to be inspected on the test object and for continuously determining positions and speeds of an inspecting tool relative to the test object Discrete position values and speed values of the inspecting tool for the respective measurement time points are stored by a storage device. A computing device determines the share of an already inspected region in relation to the total region of the test object to be inspected. The method and device can be used for manual inspection of test objects having a plurality of different shapes. The inspecting person is effectively relieved and the process for the non-destructive inspection is documented in order to guarantee a complete inspection.