The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Sep. 20, 2017
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Hiroaki Takao, Saitama, JP;

Takeshi Misawa, Saitama, JP;

Takeshi Kamiya, Saitama, JP;

Tomonori Masuda, Saitama, JP;

Koudai Fujita, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01B 11/02 (2006.01); G01B 11/25 (2006.01); G01C 3/06 (2006.01); G01S 17/42 (2006.01); G01S 17/89 (2006.01); G06T 7/521 (2017.01);
U.S. Cl.
CPC ...
G01B 11/026 (2013.01); G01B 11/25 (2013.01); G01C 3/06 (2013.01); G01S 17/42 (2013.01); G01S 17/89 (2013.01); G06T 7/521 (2017.01); G06T 2207/10028 (2013.01);
Abstract

The distance image acquisition apparatus () includes a projection unit () which projects a first pattern of structured light distributed in a two-dimensional manner with respect to a subject within a distance measurement region, a light modulation unit () which spatially modulates the first pattern projected from the projection unit (), an imaging unit () which is provided in parallel with and apart from the projection unit () by a baseline length, and captures an image including the first pattern reflected from the subject within the distance measurement region, a pattern extraction unit (A) which extracts the first pattern spatially modulated by the light modulation unit () from the image captured by the imaging unit (), and a distance image acquisition unit (B) which acquires a distance image indicating a distance of the subject within the distance measurement region based on the first pattern.


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