The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2018
Filed:
Dec. 18, 2013
United Technologies Corporation, Farmington, CT (US);
Thomas H. Rogers, East Hampton, CT (US);
Randall W. Joyner, Union, CT (US);
James R. Murdock, Tolland, CT (US);
Andrew J. Brinks, Fenton, MI (US);
Michael A. Morden, Holt, MI (US);
UNITED TECHNOLOGIES CORPORATION, Farmington, CT (US);
Abstract
A method of inspecting components between a pre-coated state and a post-coated state is provided. The method entails providing at least first and second datum points onto the component in the pre-coated state, where each of the at least first and second datum points have a substantially hemi-spherical shape and a center point. The center points of each of the at least first and second datum points are utilized for measurement of a selected portion on the component in the pre-coated state. Then, the component is coated. Next, the center points of each of the at least first and second datum points are utilized for measurement of the selected portion on the component in the post-coated state. The pre-coated state measurements and the post-coated state measurements are then correlated for inspection purposes.