The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Apr. 19, 2017
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Tomoyuki Shiiya, Matsumoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/045 (2006.01); B41J 2/21 (2006.01);
U.S. Cl.
CPC ...
B41J 2/04505 (2013.01); B41J 2/04586 (2013.01); B41J 2/2135 (2013.01);
Abstract

There is provided a printing apparatus including: a mark detector which detects a mark that is formed on a recording medium and has a width in a first direction in a detection region thereof, and is supported to be rotatable around a rotation shaft that is parallel to a second direction intersecting with the first direction; a driving portion which drives the mark detector in the first direction; an angle determination portion which determines a rotation angle of the mark detector that considers the rotation shaft as a center; and a control portion which matches positions of the detection region and the mark in the first direction by adjusting a position of the mark detector in the first direction by the driving portion based on the rotation angle of the mark detector which is determined by the angle determination portion.


Find Patent Forward Citations

Shiiya, Tomoyuki. (2018). Printing apparatus and position adjusting method of mark detector (U.S. Patent No. 9925764). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9925764

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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