The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Jun. 11, 2015
Applicant:

The Procter & Gamble Company, Cincinnati, OH (US);

Inventors:

Thomas Elliot Rabe, Baltimore, MD (US);

Faiz Feisal Sherman, Mason, OH (US);

Stephan Gary Bush, Liberty Township, OH (US);

Stephan James Andreas Meschkat, Bad Soden, DE;

Assignee:

The Procter & Gamble Company, Cincinnati, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61M 35/00 (2006.01); A61B 5/107 (2006.01); H04N 1/62 (2006.01);
U.S. Cl.
CPC ...
A61M 35/003 (2013.01); A61B 5/1079 (2013.01); H04N 1/628 (2013.01); A61M 2205/3306 (2013.01); A61M 2205/50 (2013.01); A61M 2210/04 (2013.01);
Abstract

A method and device for analyzing and treating tonal imperfections on human skin. The method has the steps of providing one or more nozzles and taking an image of skin adjacent the nozzles. A central processing unit calculates a plurality of local L values of the skin near nozzles and calculates a background L. The background L may be the arithmetic average, median, or mean of the plurality of local Ls near nozzles. Skin deviations are areas of skin where the absolute value of the difference between a local L and the background L, ΔL, is greater than a predetermined ΔL. Skin deviations are identified by this method and then treated with a treatment composition.


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