The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Sep. 25, 2014
Applicant:

Zimmer Inc, Warsaw, IN (US);

Inventors:

Pierre Couture, Montreal, CA;

Trong Tin Nguyen, Laval, CA;

Anselm Jakob Neurohr, Montreal, CA;

Jean-Sébastien Mérette, Mont-St-Hilaire, CA;

Assignee:

ZIMMER, INC., Warsaw, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 17/15 (2006.01); A61B 17/17 (2006.01); G06F 19/00 (2018.01); A61B 34/10 (2016.01); A61B 17/56 (2006.01);
U.S. Cl.
CPC ...
A61B 17/154 (2013.01); A61B 17/155 (2013.01); A61B 17/157 (2013.01); A61B 17/1764 (2013.01); A61B 34/10 (2016.02); G06F 19/3437 (2013.01); A61B 2017/568 (2013.01); A61B 2034/108 (2016.02);
Abstract

A method of creating a patient specific instrument (PSI) for use in knee replacement surgery is described which includes performing at least two X-ray scans of a bone, each of the X-ray scans being taken from different angular positions, generating a digital bone model of the bone based solely on the X-ray scans, planning the PSI based on the digital bone model, including determining locations for one or more anchor points on the PSI which are adapted to abut a surface of the bone, the determined locations of the anchor points being disposed on the PSI at locations corresponding to areas of expected high accuracy on the digital bone model generated by the X-ray scans. The areas of expected high accuracy include at least a peripheral bone contour in at least one of the angular position of the X-ray scans. A suite of such PSI instruments is also described.


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