The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2018

Filed:

Mar. 25, 2016
Applicants:

Vatech Co., Ltd., Gyeonggi-do, KR;

Vatech Ewoo Holdings Co., Ltd., Gyeonggi-do, KR;

Inventors:

Se Yeol Im, Gyeonggi-do, KR;

Dong Wan Seo, Gyeonggi-do, KR;

Tae Hee Han, Gyeonggi-do, KR;

Assignees:

VATECH Co., Ltd., Gyeonggi-do, KR;

VATECH EWOO Holdings Co., Ltd., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/14 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
A61B 6/14 (2013.01); A61B 6/032 (2013.01); A61B 6/463 (2013.01); A61B 6/466 (2013.01); A61B 6/5217 (2013.01); A61B 6/5235 (2013.01); G06T 7/62 (2017.01); G06T 2207/10081 (2013.01); G06T 2207/20092 (2013.01); G06T 2207/30036 (2013.01);
Abstract

Disclosed herein is a method and apparatus for operating an X-ray image processing system of creating a panoramic image based on three-dimensional (3D) Computed Tomography (CT) image data and displaying the panoramic image on the display unit, receiving a part of an object to be measured in the panoramic image through the input unit, and calculating an actual 3D length of the part of the object based on depth information of the CT image data and displaying the actual 3D length on the display unit. The part of the object can be selected by the user to measure a length of a desired part.


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