The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Sep. 22, 2016
Applicant:
Fluke Corporation, Everett, WA (US);
Inventors:
Assignee:
Fluke Corporation, Everett, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); G06T 7/00 (2017.01); G06T 7/20 (2017.01); G01J 5/10 (2006.01); G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G01J 5/10 (2013.01); G06T 7/003 (2013.01); G06T 7/0018 (2013.01); G06T 7/204 (2013.01); G01J 2005/0077 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30204 (2013.01);
Abstract
Disclosed is an imaging device employing a measurement zone directed at a target, where the imaging device can be used in conjunction with a misalignment analysis feature. The imaging device can capture first and second images at different times. The first and second images may be compared, such as by comparing a location of the measurement zone of the imaging device in the first image with a location of the measurement zone of the imaging device in the second image. Based on the comparison, a misalignment indication of the imaging device relative to the target can be provided.