The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Mar. 11, 2016
Seek Thermal, Inc., Santa Barbara, CA (US);
Romeo Chahine, Goleta, CA (US);
William J. Parrish, Santa Barbara, CA (US);
Jeffery Lee, Goleta, CA (US);
Ross Williams, Santa Barbara, CA (US);
Andreas Engberg, Santa Barbara, CA (US);
Jason Wolfe, Santa Barbara, CA (US);
Seek Thermal, Inc., Santa Barbara, CA (US);
Abstract
A method and an imaging system for adaptive shutter control wherein an imaging system can be configured to actuate a calibration element at various times and develop an offset correction or Non-Uniformity Correction (NUC). The system control processing units may acquire information derived from calibration data, regular imaging data or external data, which may be correlated with how fast the NUC is changing over time. How often calibration element is actuated may be adaptively determined from the correlating information and the actuation times may be adaptively controlled to optimally actuate as needed. In some embodiments the calibration element may be a shutter and calibration activation may include closing the shutter and providing a flat field image for calibration purposes.