The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Dec. 11, 2012
Applicants:

Dirk Adams, Tongeren, BE;

Pieter Op DE Beeck, Kortenaken, BE;

Inventors:

Dirk Adams, Tongeren, BE;

Pieter Op de Beeck, Kortenaken, BE;

Assignee:

Visys NV, Hasselt, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/235 (2006.01); G01N 21/85 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2017.01); G01N 21/89 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2353 (2013.01); G01N 21/85 (2013.01); G01N 21/8806 (2013.01); G06T 7/0004 (2013.01); G01N 21/8901 (2013.01); G01N 2021/8838 (2013.01);
Abstract

A system and a method for inspecting a stream of products (″) is disclosed, comprising a scanning focused light beam () for scanning the product stream and a camera () for detecting light beams directly returned from the scanned product stream, whereby the scanning movement of the focused light beam is synchronized with the exposure time of the camera.


Find Patent Forward Citations

Adams, Dirk. (2018). System and method for individually inspecting objects in a stream of products and a sorting apparatus comprising such system (U.S. Patent No. 9924105). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9924105

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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