The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Aug. 24, 2016
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Jaiganesh Balakrishnan, Bangalore, IN;

Jawaharlal Tangudu, Bangalore, IN;

Sreenath Narayanan Potty, Bangalore, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/14 (2006.01); H03K 9/00 (2006.01); H04L 25/03 (2006.01); H04L 12/741 (2013.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 25/03006 (2013.01); H04L 43/022 (2013.01); H04L 45/745 (2013.01);
Abstract

A re-sampler comprises: a plurality of multipliers configured to receive an input sample; and a plurality of accumulators coupled to the multipliers and configured to form multiplier-accumulator (MAC) units with the multipliers, wherein the MAC units are configured to: compute partial products from the input sample, accumulate the partial products over clock cycles, and sequentially generate output samples based on the computing and the accumulating. A method comprises: receiving input samples; computing partial products from the input samples; accumulating the partial products over clock cycles; and sequentially generating output samples based on the computing and the accumulating.


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