The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Jul. 27, 2015
Applicant:

Ixia, Calabasas, CA (US);

Inventors:

Bogdan Tenea, Bucharest, RO;

Alon Regev, Woodland Hills, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04J 3/06 (2006.01); H04J 3/14 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
H04J 3/14 (2013.01); H04J 3/0667 (2013.01); H04L 43/0852 (2013.01); H04L 43/50 (2013.01); G01R 31/31922 (2013.01); H04L 43/106 (2013.01);
Abstract

A system for testing recovered clock quality includes a test device for operating as a timing synchronization protocol master for communicating with a device under test functioning as a timing synchronization protocol slave or a timing synchronization protocol boundary clock to synchronize a clock of the device under test with a clock of the test device. The system further includes a recovered clock quality tester for receiving, from the device under test, a reverse synchronization message including clock information and for using the clock information to quantify a synchronization error between the clock of the device under test and the clock of the test device.


Find Patent Forward Citations

Loading…