The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Mar. 31, 2015
Eospace Inc., Redmond, WA (US);
David Emil Moilanen, Bellevue, WA (US);
Matthew Allen Hall, Chicago, IL (US);
EOSpace Inc., Redmond, WA (US);
Abstract
The invention introduces a new RF test and measurement methodology based on optical signal processing that has the capability to measure all of the RF parameters (both amplitude and phase) of an electronic component or system including transmission (S) and reflection (S). It can also be applied to measuring the electro-optic properties of electro-optic modulators, both phase modulators and intensity modulators. The basis of the invention is to use the RF information encoded in the optical sidebands generated by an electro-optic modulator to determine all of the relevant parameters of an electronic or electro-optic device. Optical carrier suppression techniques are used to isolate the information carrying optical sidebands from the dominant optical carrier.