The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Mar. 31, 2016
Applicant:
Cypress Semiconductor Corporation, San Jose, CA (US);
Inventors:
Rishi Raghav Bacchu, San Jose, CA (US);
Kaveh Hosseini, Cork, IE;
Dermot MacSweeney, Cork, IE;
Paul M. Walsh, Cork, IE;
Kofi Makinwa, San Jose, CA (US);
Assignee:
Cypress Semiconductor Corporation, San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 3/00 (2006.01); G01R 27/26 (2006.01); H03F 3/45 (2006.01); H03M 3/02 (2006.01);
U.S. Cl.
CPC ...
H03M 3/322 (2013.01); G01R 27/2605 (2013.01); H03F 3/45071 (2013.01); H03F 3/45475 (2013.01); H03M 3/424 (2013.01); H03F 2200/129 (2013.01); H03F 2203/45146 (2013.01); H03F 2203/45288 (2013.01); H03F 2203/45522 (2013.01); H03M 3/02 (2013.01);
Abstract
A circuit, system, and method for measuring capacitance are described. A current may be received at an input of a conversion circuit. The current may be converted to a voltage signal which may be used to create a negative feedback current to the input of the conversion circuit and which may be demodulated digitally to provide a static digital output representative of a capacitance.