The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Jun. 20, 2017
Applicant:
Sii Semiconductor Corporation, Chiba-shi, Chiba, JP;
Inventor:
Yasushi Imai, Chiba, JP;
Assignee:
SII SEMICONDUCTOR CORPORATION, Chiba, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05F 1/00 (2006.01); G05F 1/565 (2006.01); H02M 3/07 (2006.01); G11C 5/14 (2006.01); H03K 5/02 (2006.01); H02M 3/155 (2006.01); G11C 16/30 (2006.01);
U.S. Cl.
CPC ...
H02M 3/07 (2013.01); G11C 5/145 (2013.01); G11C 16/30 (2013.01); H02M 3/155 (2013.01); H03K 5/023 (2013.01);
Abstract
Provided is a booster circuit enabling improvement of efficiency of a stress test for a circuit to which a boosted voltage is applied. A voltage divider circuit is configured to have a voltage-dividing ratio that is variable depending on a test signal, and a limiter circuit is configured to clamp a voltage to a voltage higher than a boosted voltage in normal operation. In a test mode, the voltage divider circuit is controlled so that the boosted voltage becomes higher than that in the normal operation, and the limiter circuit clamps the boosted voltage, with the result that a booster section continuously operates.