The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Jul. 21, 2015
Applicant:

Sumitomo Chemical Company, Limited, Tokyo, JP;

Inventors:

Chikae Yoshimaru, Osaka, JP;

Kosuke Kurakane, Osaka, JP;

Chikara Murakami, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01M 2/16 (2006.01); B32B 5/32 (2006.01); B32B 27/32 (2006.01); B32B 15/085 (2006.01); B32B 15/20 (2006.01); B32B 27/20 (2006.01); C09D 1/00 (2006.01);
U.S. Cl.
CPC ...
H01M 2/1686 (2013.01); B32B 5/32 (2013.01); H01M 2/166 (2013.01); B32B 15/085 (2013.01); B32B 15/20 (2013.01); B32B 27/205 (2013.01); B32B 27/32 (2013.01); B32B 2255/06 (2013.01); B32B 2255/10 (2013.01); B32B 2255/20 (2013.01); B32B 2255/26 (2013.01); B32B 2264/10 (2013.01); B32B 2264/102 (2013.01); B32B 2264/108 (2013.01); B32B 2264/12 (2013.01); B32B 2307/58 (2013.01); B32B 2307/718 (2013.01); B32B 2307/732 (2013.01); B32B 2457/10 (2013.01); B32B 2571/00 (2013.01); C09D 1/00 (2013.01); H01M 2/1646 (2013.01); H01M 2/1653 (2013.01);
Abstract

Provided is a laminate which is capable of ensuring a high level of safety by preventing an internal short circuit due to, for example, breakage of a non-aqueous electrolyte secondary battery while maintaining various performance capabilities of the non-aqueous electrolyte secondary battery. A laminate () includes: a porous film containing polyolefin as a main component; and a porous layer containing fine particles; the porous layer being laminated to at least one side of the porous film, in an electrical conduction test by nail penetration in which test a displacement in a thickness direction of the laminate () during a period from when a dielectric breakdown occurs in the laminate () to when the laminate () is brought into electrical conduction is measured by use of a nail () of N50 specified in JIS A 5508 and under a condition in which the nail () descends at a descending speed of 50 μm/min, the displacement being not less than 20 μm and not more than 200 μm.


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