The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Aug. 19, 2016
Crystal Instruments Corporation, Santa Clara, CA (US);
Yihao Liu, Hangzhou, CN;
Hongjian Gao, Linhai, CN;
James Zhuge, Palo Alto, CA (US);
Weijie Zhao, Los Gatos, CA (US);
CRYSTAL INSTRUMENTS CORPORATION, Santa Clara, CA (US);
Abstract
A shaker test apparatus is provided along with a method of collecting and processing images, wherein a shaker table is driving the device under test by a vibration controller at a known vibration frequency and period, wherein a device under test obtains a steady-state vibration characteristic of that excitation frequency when mounted on the shaker table. While the device under test is being excited, a trigger signal controller triggers a camera to capture a series of still image frames at a regular sampling frequency that is less than the vibration frequency (under-sampling), and a timer associated with the camera records a timestamp of an image capture time for each image frame. A computer processor uses the timestamps to remap the order of the image frames, shifting each frame's capture time backwards by a specified multiple of vibration periods in order to correctly represent a single vibration period beginning with an earliest captured image.