The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2018
Filed:
Feb. 13, 2017
International Electronic Machines Corporation, Troy, NY (US);
Zahid F. Mian, Loudonville, NY (US);
Ryk E. Spoor, Troy, NY (US);
Ronald W. Gamache, East Greenbush, NY (US);
International Electronic Machines Corp., Troy, NY (US);
Abstract
A solution including a noncontact electronic measurement device is provided. The measurement device includes one or more imaging devices configured to acquire image data of a surface of an object located in a measurement region relative to the measurement device and one or more projected pattern generators configured to generate divergent pattern(s) of structured light, which impact the surface of the object within a field of view of the imaging device when the object is located in the measurement region. Using image data acquired by the imaging device(s), a computer system can measure a set of attributes of the surface of the object and/or automatically determine whether the measurement device is within the measurement region. An embodiment is configured to be held by a human user during operation.