The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Feb. 26, 2014
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Zisheng Li, Tokyo, JP;

Tsuneya Kurihara, Tokyo, JP;

Harumi Kiyomizu, Tokyo, JP;

Tatsuhiko Kagehiro, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G07C 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00228 (2013.01); G06K 9/00288 (2013.01); G06K 9/6203 (2013.01); G07C 9/00158 (2013.01);
Abstract

A face authentication system of an example of the present invention includes: a first face area detection unit configured to detect a first face image from a first captured image captured by a camera; a first deformation unit configured to deform the first face image non-linearly using a template face image; a face image recording unit configured to record the deformed first face image as a registered face image; a second face area detection unit configured to detect a second face image from a second captured image captured by a camera; a second deformation unit configured to deform the second face image non-linearly using the template face image; and a face image matching unit configured to compare the deformed second face image with the registered face image.


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