The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Jun. 28, 2017
Applicant:

Fingerprint Cards Ab, Göteborg, SE;

Inventors:

Frank Riedijk, Delft, NL;

Wouter Brevet, Delft, NL;

Lars Christensen, Charlottenlund, DK;

Søren Christensen, Dyssegaard, DK;

Michael Hansen, Søborg, DK;

Assignee:

FINGERPRINT CARDS AB, Göteborg, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/0002 (2013.01); G06K 9/00067 (2013.01);
Abstract

A method of determining a representation of a physical property of a finger using a finger sensing system comprising a two-dimensional measuring arrangement including a plurality of measuring elements, each defining a measuring element position in the measuring arrangement, and each comprising a finger electrode spaced apart from the finger by a dielectric structure. For each of the measuring element positions, the method comprises providing a measuring configuration in which the finger electrode of a sensing measuring element defining the measuring element position exhibits a sensing finger electrode potential; the finger electrode of a first different measuring element exhibits a first different finger electrode potential; and the finger electrode of a second different measuring element exhibits a second different finger electrode potential; acquiring a measurement value based on a sensing signal; and determining the representation of the physical property of the finger based on a plurality of measurement values.


Find Patent Forward Citations

Loading…