The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Jul. 20, 2016
Applicant:

Sandisk Technologies Llc, Plano, TX (US);

Inventors:

Nicholas James Thomas, Dundee, GB;

Oleg Kragel, San Jose, CA (US);

Michael Anthony Moser, San Jose, CA (US);

Assignee:

SanDisk Technologies LLC, Plano, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0246 (2013.01); G06F 12/0253 (2013.01); G06F 2212/1044 (2013.01); G06F 2212/2022 (2013.01); G06F 2212/7205 (2013.01);
Abstract

A system and method is disclosed for tracking block mapping overhead in a non-volatile memory. The system may include a non-volatile memory having multiple memory blocks and a processor configured to track a block level mapping overhead for closed blocks of the multiple memory blocks. The processor may be configured to track predetermined logical address ranges within which data written to a block fall, and then store the sum of the number of different logical address ranges for each respective block as a block address entropy metric. The method may include the processor using the block address entropy metric to select source blocks for garbage collection with a lower block address entropy metric or to adjust other operational characteristics such as data routing within the non-volatile memory system based on average block address entropy for a group of blocks.


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