The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 20, 2018

Filed:

Dec. 04, 2015
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Yuji Mizobuchi, Kawasaki, JP;

Kuniharu Takayama, Tama, JP;

Satoshi Munakata, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/368 (2013.01); G06F 11/3684 (2013.01);
Abstract

A test selection method includes: generating, by a computer, relationship information that includes information indicating whether there is a relationship between each pair of one of a plurality of first tests and one of a plurality of second tests, and information on the number of relationships that indicates the number of pairs having the relationship from among a plurality of the pairs, by use of a result of performing the plurality of first tests and a result of performing the plurality of second tests; and when a specific test included in the plurality of first tests is designated, extracting by the computer, from among the plurality of second tests, a related test that relates to the specific test, on the basis of the relationship information and the information on the number of relationships.


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